Researcher(s)
- John Shaw, Computer Engineering, University of Delaware
Faculty Mentor(s)
- Tingyi Gu, ECE, University of Delaware
Abstract
Raman spectroscopy is an analytical technique that uses laser light to measure the inelastic scattering of photons, providing insights into the chemical structure of materials. My objective was to set up a free-space Raman spectroscopy system specifically for analyzing 2D materials. Over the course of two months, I iterated on the design multiple times to optimize the setup. The final configuration includes a 633 nm visible light laser that passes through a 633 nm bandpass filter, leading to a 50:50 beam splitter. Half of the light is directed to a 50x microscope objective, which focuses it onto the 2D material sample. The light reflected from the sample travels back through the microscope objective, is redirected by the beam splitter, and passes through a 633 nm band-stop notch filter into a single-mode fiber. This fiber guides the light to a beam collimator, which directs it through a 50 mm and a 400 mm focal length lens before entering the spectrometer slit. This setup allows for bending and heating the samples, offering more versatility compared to traditional 2D Raman spectroscopy setups that are constrained by a microscope. The flexibility of our design enables a broader range of experimental conditions. Currently, we are not getting expected results for our test sample of Silicon. Future additions to the setup will include an x-y-z movable stage for the sample and a camera to focus on specific 2D flakes.